PUMA
Istituto di Scienza e Tecnologie dell'Informazione     
D'Acunto M., Pieri G., Righi M., Salvetti O. A methodological approach for combining superresolution and pattern recognition to image identification. In: Pattern Recognition and Image Analysis, vol. 24 (2) pp. 209 - 217. Springer, 2014.
 
 
Abstract
(English)
Image acquisition systems integrated with laboratory automation produce multidimensional datasets. An effective computational approach for automatic analysis of image datasets is given by pattern rec ognition methods; in some cases, it can be advantageous to accomplish pattern recognition with image super resolution procedures. In this paper, we define a method derived from pattern recognition techniques for the recognition of artefacts and noise on set of images combined with super resolution algorithms. The advantage of our approach is automatic artefacts recognition, opening the possibility to build a general framework for artefact recognition independently by the specific application where it is used.
Abstract
(Italiano)
In questo lavoro sono stati applicati alcuni metodi di pattern recognition combinati con metodi di super-risoluzione per identificare componenti di sistemi biologiici, in particolare cellule, le cui immagini sono state acquisite con microscopi a forza atomica.
URL: http://link.springer.com/article/10.1134%2FS1054661814020023#
DOI: 10.1134/S1054661814020023
Subject super-risolution and image analysis
pattern-recognition
AFM microscope
image analysis
I.4.5 Reconstruction
I.4.10 Image Representation
62H10 Distribution of statistics


Icona documento 1) Download Document PDF


Icona documento Open access Icona documento Restricted Icona documento Private

 


Per ulteriori informazioni, contattare: Librarian http://puma.isti.cnr.it

Valid HTML 4.0 Transitional