PUMA
Istituto dei materiali per l'elettronica ed il magnetismo     
Mazzera M., Baraldi A., Buffagni E., Capelletti R., Földvári I. High resolution spectroscopy to investigate impurity traces in YAB single crystals. In: Crystal Research and Technology, vol. 46 (8) pp. 755 - 760. Special Issue: Italien Crystal Growth Conference 2010 (ICG2010). WILEY-VCH, 2011.
 
 
Abstract
(English)
The work explores the feasibility of high resolution (as fine as 0.02 cm-1) Fourier transform spectroscopy applied at 9 K in the 500-25000 cm-1 range to detect traces of unwanted impurities, mainly rare earths (RE3+)in crystals: the system chosen is YAl3(BO3)4 (YAB). Weak traces of RE3+ (Nd, Dy, Er, Tm, Yb), but also of Cr3+ and OH-, were successfully monitored by comparing the spectra of YAB samples under examination with those intentionally doped with a given ion. The analysis performed on a variety of samples shows how Cr3+, Nd3+, and Yb3+ are the most frequent unwanted dopants and can provide suggestions to the crystal growers about the performances of different crystal growth lines. According to a preliminary evaluation, the Er3+ traces detection limit is as low as 1-2×10-4 mol% in 1 cm thick samples. The advantages of the method, which is sample non-destructive, are discussed in comparison with those currently applied.
DOI: 10.1002/crat.201000619
Subject high resolution spectroscopy
impurity detection
lanthanides


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