PUMA
Istituto dei materiali per l'elettronica ed il magnetismo     
Marchini L., Zambelli N., Piacentini G., Zha M., Calestani D., Belas E., Zappettini A. Characterization of CZT crystals grown by the boron oxide encapsulated vertical Bridgman technique for the preparation of X-ray imaging detectors. In: Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, vol. 633 (Suppl. 1) pp. S92 - S94. 11th International Workshop on Radiation Imaging Detectors (IWORID). Elsevier, 2011.
 
 
Abstract
(English)
CdZnTe crystals for the preparation of X-ray imaging detectors have been grown by the boron oxide encapsulated vertical Bridgman method. The homogeneity of the crystals has been studied by photoluminescence mapping, energy-dispersive X-ray analysis, and resistivity mapping. The zinc distribution follows an anomalous behavior that deviates from the normal freezing equation. The wafers cut perpendicular to the growth direction show a homogeneous resistivity distribution, suggesting the possible exploitation of these crystals for the production of large volume imaging detectors.
URL: http://www.sciencedirect.com/science/article/pii/S0168900210013239
DOI: 10.1016/j.nima.2010.06.133
Subject CZT
X-ray radiation detector


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