PUMA
Istituto dei materiali per l'elettronica ed il magnetismo     
Mazzera M., Baraldi A., Buffagni E., Capelletti R., Földvári I. High resolution spectroscopy to investigate impurities in YAB single crystals. In: ICG 2010 - Italian Crystal Growth - Progress in Functional Materials (Parma, 18-19 november 2010).
 
 
Abstract
(English)
The work explores the feasibility of high resolution (as fine as 0.02 cm-1) Fourier transform spectroscopy applied at 9 K in the 500-25000 cm-1 range to detect traces of unwanted impurities, mainly rare earths (RE3+) in crystals: the system chosen is YAl3(BO3)4 (YAB). Weak traces of RE3+ (Nd, Dy, Er, Tm, Yb), but also of Cr3+ and OH-, were successfully monitored by comparing the spectra of YAB samples under examination with those intentionally doped with a given ion. The analysis performed on a variety of samples shows how Cr3+, Nd3+, and Yb3+ are the most frequent unwanted dopants and can provide suggestions to the crystal growers about the performances of different crystal growth lines. According to a preliminary evaluation, the Er3+ traces detection limit is as low as 1-2x10-4 mol% in 1 cm thick samples. The advantages of the method, which is sample non-destructive, are discussed in comparison with those currently applied.
Subject YAB
impurity traces
high resolution spectroscopy


Icona documento 1) Download Document PDF


Icona documento Open access Icona documento Restricted Icona documento Private

 


Per ulteriori informazioni, contattare: Librarian http://puma.isti.cnr.it

Valid HTML 4.0 Transitional