PUMA
Istituto dei materiali per l'elettronica ed il magnetismo     
Seravalli L., Frigeri P., Nasi L., Trevisi G., Bocchi C. Metamorphic quantum dots: Quite different nanostructures. In: Journal of Applied Physics, vol. 108 (6) article n. 064324. AIP, 2010.
 
 
Abstract
(English)
In this work, we present a study of InAs quantum dots deposited on InGaAs metamorphic buffers by molecular beam epitaxy. By comparing morphological, structural, and optical properties of such nanostructures with those of InAs/GaAs quantum dot ones, we were able to evidence characteristics that are typical of metamorphic InAs/InGaAs structures. The more relevant are: the cross-hatched InGaAs surface overgrown by dots, the change in critical coverages for island nucleation and ripening, the nucleation of new defects in the capping layers, and the redshift in the emission energy. The discussion on experimental results allowed us to conclude that metamorphic InAs/InGaAs quantum dots are rather different nanostructures, where attention must be put to some issues not present in InAs/GaAs structures, namely, buffer-related defects, surface morphology, different dislocation mobility, and stacking fault energies. On the other hand, we show that metamorphic quantum dot nanostructures can provide new possibilities of tailoring various properties, such as dot positioning and emission energy, that could be very useful for innovative dot-based devices.
URL: http://jap.aip.org/resource/1/japiau/v108/i6/p064324_s1
DOI: 10.1063/1.3483249
Subject Metamorphic quantum dots
atomic force microscopy
transmission electron microscopy
81.07.Ta
81.05.Ea
78.67.Hc
61.46.Df
81.16.-c
81.15.Hi


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