Istituto dei materiali per l'elettronica ed il magnetismo     
Allia P., Celegato F., Coisson M., Tiberto P., Vinai F., Albertini F., Casoli F., Fabbrici S. Competing magnetoresistance contributions in sputtered FePt thin films. In: Journal of Magnetism and Magnetic Materials, vol. 322 (14) pp. 1898 - 1903. Elsevier, 2010.
Fe-Pt thin films were deposited by rf sputtering on an MgO substrate heated at different temperatures to induce the formation of the perpendicular Fe-Pt L10 phase with a different grain morphology on the nanometer scale. All films are characterized by a mazelike pattern of FePt nanograins with interconnected bases. MFM images and magnetization curves indicate that all samples have a strong perpendicular magnetic anisotropy arising from (0 0 1) growth. The temperature behaviour of the electrical resistance indicates that a percolating path exists for conduction electrons in the mazelike pattern. The magnetoresistance was measured as a function of magnetic field (applied longitudinally) and temperature in the ranges -70 kOe < H < + 70 kOe and 4 K < T < 150 K, respectively. All samples display a complex behaviour of the electrical resistance as a function of applied field. The role of the different magnetoresistance effects (both intrinsic and extrinsic) measured in these FePt thin films is elucidated.
URL: http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TJJ-4Y65SJ0-1&_user=6689909&_coverDate=07%2F31%2F2010&_rdoc=1&_fmt=high&_orig=search&_origin=search&_sort=d&_docanchor=&view=c&_acct=C000061181&_version=1&_urlVersion=0&_userid=6689909&md5=ab8e1dd
DOI: 10.1016/j.jmmm.2010.01.004
Subject Magnetic thin films
Magnetic nanostructure

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