PUMA
Istituto dei materiali per l'elettronica ed il magnetismo     
Albertini F., Fabbrici S., Casoli F., Nasi L., Chernenko V., Righi L., Solzi M., Olvera Cervantes J., Besseghini S., Gambardella A. Effects of growth parameters on magnetism and structure in NiMnGa thin films deposited on MgO. In: SMM19 - 19th Soft Magnetic Materials Conference (Torino, 6-9 settembre 2009).
 
 
Abstract
(English)
NiMnGa alloys have attracted a great deal of interest for huge magnetic-field-induced strains and giant magnetocaloric effects, due to the strong interplay between magnetic and structural degrees of freedom. NiMnGa thin films represent a new interesting topic of research for the promising applications in the field of sensors and actuators. In the present paper NiMnGa thin films of thickness 0.02-0.1 mm were prepared by r.f.sputtering and thoroughly characterized by means of X-ray diffraction, magnetic, and resistivity measurements as a function of temperature. Electron and scanning probe microscopy were utilized to study morphology and domain structure. Epitaxial (100) cubic thin films were obtained by growing NiMnGa on MgO (100) substrates at temperatures above 400 C. Below room temperature the parent austenitic phase was found to transform into orthorhombic/monoclinic martensite, with b-axis perpendicular to the film plane. The effects of growth parameters and thickness on Curie and transformation temperatures, magnetism, and domain structure will be discussed.
Subject Ni2MnGa
Martensitic phase
Diffraction
Structural modulation
Crystal structure


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