Istituto dei materiali per l'elettronica ed il magnetismo     
Zanichelli M., Pavesi M., Marchini L., Zappettini A. Characterization of Bulk and Surface Transport Mechanisms by Means of the Photocurrent Technique. In: RTSD 2008 - 16th International Workshop on Room Temperature Semiconductor X-Ray and Gamma-Ray Detectors (Dresden (Germany), 18-25 Ottobre 2008).
The authors exploit the peculiarity of this technique by studying planar samples of different thickness which underwent different surface processing (like etching, passivation, contact deposition), comparing the achieved results with the answers of different experimental techniques, like X and Gamma ray spectroscopy, current-tension characterization and absorption, transmission and photoluminescence measurements.
Subject CdZnTe, X-ray detectors

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