Istituto dei materiali per l'elettronica ed il magnetismo     
Marchini L., Zappettini A., Gombia E., Mosca R., Pavesi M. Study of Surface Treatment Effects on the Metal-CdZnTe Interface. In: RTSD 2008 - 16th International Workshop on Room Temperature Semiconductor X-Ray and Gamma-Ray Detectors (Dresden (Germany), 19-25 Ottobre 2008).
In this work it has been investigated the influence of different surface treatments on the electrical properties of the metal-CdZnTe interface. The study was performed on Cd0.9Zn0.1Te grown by Boron Oxide Encapsulated Vertical Bridgman technique. Samples of nearly 7mm x 7mm x 1.5mm were cut out of the grown ingots. Contacts were prepared using different procedures and current-voltage characteristics were recorded to monitor the effect of different surface treatments on the electrical characteristics of the device.
Subject CdZnTe
X-ray detectors

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