PUMA
Istituto dei materiali per l'elettronica ed il magnetismo     
Auricchio N., Caroli E., Donati A., Marchini L., Zanichelli M., Zappettini A., Quadrini E. M. Spectroscopic response of CZT detectors obtained by the boron encapsulated vertical Bridgman method. In: RTSD 2008 - 16th International Workshop on Room Temperature Semiconductor X-Ray and Gamma-Ray Detectors (Dresden (Germany), 19-25 Ottobre 2008).
 
 
Abstract
(English)
The purpose of this paper is to present the spectral response at different energies of some CZT crystals grown with the boron oxide encapsulated vertical Bridgman method by IMEM-CNR. The most important feature of the technique is that the crystal, during the growth, is fully encapsulated by a thin layer of liquid boron oxide, so that the crystal-crucible contact is prevented. Using this material, several detectors were realized of about 4x4x1 mm3 in size and with electrical gold contacts on both the surfaces obtained by two different techniques: vacuum vaporization deposition and electroless.
Subject CdZnTe
X-ray detectors


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