Istituto dei materiali per l'elettronica ed il magnetismo     
Albertini F., Nasi L., Casoli F., Fabbrici S., Luches P., Gazzadi G. C., Di Bona A., Vavassori P., Valeri S., Contri S. F. Local modifications of magnetism and structure in FePt(001) epitaxial thin films by focused ion beam: Two-dimensional perpendicular patterns. In: Journal of Applied Physics, vol. 104 article n. 053907. American Institute of Physics, 2008.
Focused ion beam was utilized to locally modify magnetism and structure of L1_0 FePt perpendicular thin films. As a first step, we have performed a magnetic, morphological, and structural study of completely irradiated FePt films with different Ga+ doses (1 x 10^13 - 4 x 10^16 ions/cm^2) and ion beam energy of 30 keV. For doses of 1 x 10^14 ions/cm^2 and above a complete transition from the ordered L1_0 to the disordered A1 phase was found to occur, resulting in a drop of magnetic anisotropy and in the consequent moment reorientation from out-of-plane to in-plane. The lowest effective dose in disordering the structure (1 x 10^14 ions/cm^2) was found not to affect the film morphology. Taking advantage of these results, continuous two-dimensional (2D) patterns of perpendicular magnetic structures (250 nm dots, 1 micron dots, 1 micron-large stripes) were produced by focused ion beam without affecting the morphology. The 2D patterns were revealed by means of magnetic force microscopy, that evidenced peculiar domain structures in the case of 1 micron dots.
URL: http://link.aip.org/link/?JAPIAU/104/053907/1
DOI: 10.1063/1.2975217
Subject Fe-Pt alloys
Focused Ion Beam patterning
patterned media

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