Istituto dei materiali per l'elettronica ed il magnetismo     
Ferrari C., Korytar D. Monocromatore monolitico per diffrattometria X ad alta risoluzione e alta efficienza. Patent n. DP2006U0006. Registered in Roma- Deposito Postale on 2006.
The patent concerns a new design of a high resolution x-ray monochromator cut form a single piece of germanium crystal. It is based on the diffraction properties of perfect crystals in the condition of grazing incidence near the critical angle for total reflection. Based on such an innovative design an increase of the diffracted intensity of about 8 times with respect to standard symmetrical monochromators is achieved, still mantaining and angular divergence of a few arcseconds.
Subject x-ray monochromator

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