PUMA
Istituto di Scienza e Tecnologie dell'Informazione     
Caruso A., Chessa S., Maestrini P. Wafer-scale VLSI testing. In: 12th Workshop on Testmethods and Reliability of Circuits and Systems (Grassau, Germany, 19-21 March 2000). Proceedings, 2000.
 
 
Abstract
(English)
No abstract available
Subject Wafer scale integration
C.2 Computer-Communication Networks
C.5.4 VLSI Systems
B.7.1 Types and Design Styles


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