Istituto di Scienza e Tecnologie dell'Informazione     
Bertolino A., Marchetti E. A simple model to predict how many more failures will appear in testing. In: 2nd International Software Quality Week Europe (Brussels, Belgium, 9-13 November 1998). Proceedings, pp. 293 - 315. 1998.
No abstract available
Subject bayesian approach
defect count models
functional testing
number of expected failures
D.2.5 Testing and Debuggin

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