Istituto di Scienza e Tecnologie dell'Informazione     
Aiello M., Lami C., Montanari U. A system for computer measurement and karyotyping of wheat methaphases. In: 1st International Joint Conference on Pattern Recognition. (Washington, ). Proceedings, pp. 205 - 219. 1973.
Wheat chromosomes are analyzed for determing useful radiation-induced mutations. In the system described here, cells are photographed at an early stage and photomicrographs are digitized with a flying spot scanner. After a suitable preprocessing which allows to separate touching chromosomes, partial and total profiles and a number of characteristic parameters are computed. Measures are then obtained from the parameters by a routine provided by the user and an optimal matching in the pattern space is found . A karyotype is finally printed.

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