Istituto di Matematica Applicata e Tecnologie Informatiche     
Fournie' M., Pietra P. Numerical simulation of 2D semiconductor devices using high-order finite difference methods. Technical report ercim.cnr.ian//1999-1132, 1999.
Numerical tests of a new accurate compact finite difference scheme for solving the 2D drift-diffusion system are presented
Subject 65N30

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